Florent Loete & Pierrick Legrand are developing a non-contact and non-destructive method to measure the electronic quality of a wide range of high-resolution semiconductors within the fields of microelectronics and photovoltaics, to address the validated interest from industrial partners.
The objective is to evaluate the quality of these materials without touching or damaging them, enabling precise results for a wide variety of high-quality semiconductors.
What is the current status of their project?
- Existing patent (FR, US, EU)
- Filing a second patent
- Prototype of a measuring instrument
- Sales of measuring instruments
- Sales of degradation measurement solutions for photovoltaic panels
Technology readiness : TRL 7
Contact us: contact@neo-sense.fr
